Description

Product details

Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray Analysis (EDX) SEM provides detailed high-resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signal

Keywords

• SEM
• EDX
• images
• surface
• detailed
• Analysis
• secondary
• electron beam
• electron signal
• Energy Dispersive
• Scanning Electron Microscopy
• Scanning Eelectron Microscopy