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At Dextrose Technologies Pvt. Ltd., we provide TEM (Transmission Electron Microscopy) to visualize internal structure at the nanoscale, enabling detailed analysis of nanoparticles, fine particulates, thin films, and advanced materials. TEM is ideal when SEM is not sufficient and you need high-resolution insight into particle dispersion, internal morphology, and lattice-level features (scope dependent on sample and preparation feasibility).
Internal structure and nanoscale imaging
TEM allows direct imaging of internal morphology, particle boundaries, and nanoscale features that drive material performance. We support comparative analysis across batches and processing conditions.
Particle dispersion and lattice structure analysis
We assess particle dispersion and aggregation trends, and support lattice-level analysis where applicable (e.g., lattice fringes / crystallographic features), helping you understand crystallinity and structural uniformity.
Deliverables
* TEM images at multiple magnifications
* Dispersion/aggregation observations (image-based)
* Lattice/structural notes where applicable
* Report-ready documentation for R&D and characterization
Get started
Share your sample type (nanoparticles/thin film/powder), expected size range, and objective (dispersion, internal structure, lattice). We’ll recommend feasibility, sample prep approach, and deliverables.
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