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At Dextrose Technologies Pvt. Ltd., we provide EDS/EDX (Energy Dispersive X-ray Analysis)—typically integrated with SEM—to deliver elemental composition and spatial mapping of materials. EDX helps identify what elements are present, where they are located, and how they are distributed, making it highly effective for contamination investigations, impurity localization, and surface/cross-sectional studies.
Elemental composition and mapping
We perform spot/area analysis and elemental mapping to understand composition and distribution trends across regions of interest.
Contaminant and impurity localization
EDX is ideal for identifying foreign particles, inclusions, deposits, corrosion products, and process contaminants by pinpointing elemental signatures at the defect site.
Surface and cross-sectional analysis
We support surface and cross-sectional evaluation (sample-prep dependent) to assess coatings, layers, diffusion regions, and interface contamination.
Deliverables
* Elemental spectra with identified peaks
* Quant summary (wt%/at% as applicable)
* Elemental maps and/or line scans (as required)
* Clear observations and interpretation notes linked to images
Get started
Share your sample type, suspected contaminant (if any), and whether you need spot analysis, mapping, or cross-section review. We’ll recommend the best SEM-EDX workflow.
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