Precision Imaging. Deeper Insights.
At Dextrose Technologies Pvt. Ltd, we provide advanced Scanning Electron Microscopy (SEM) analysis services to help researchers, innovators, and industries explore micro- and nano-scale structures with unmatched clarity. Our high-resolution SEM systems are ideal for analyzing surface morphology, material composition, and structural features across a wide range of applications.
What We Offer:
Magnification: Up to 300, 000x
Resolution: Down to 1 nanometer
Imaging Modes: Secondary Electron (SE) & Backscattered Electron (BSE)
Elemental Analysis: Energy Dispersive X-ray Spectroscopy (EDS/EDX)
Sample Types: Metals, polymers, composites, biological materials, coatings, textiles, ceramics, and more
Key Applications
Surface topography and texture analysis
Particle size and shape characterization
Nanomaterial and fiber structure examination
Failure analysis and quality control
Coating and thin film evaluation
Elemental mapping for compositional studies
What You Receive
* High-resolution SEM images (JPEG, TIFF, or PNG)
* Optional EDX spectra and elemental distribution maps
* Technical analysis reports (on request)
* Secure cloud-based file delivery or USB option
⏱ Turnaround Time
Standard Service: 3–5 working days
Express Service: 24–48 hours (available at additional cost)
